Diwaker Jha
Research Interests:
I am interested in developing new methods for high resolution imaging, investigation of porous materials by means of X-ray scattering techniques, small angle scattering, X-ray reflectivity, micro and nano tomography using synchrotron radiation sources, study of flow properties, pore throat distribution and their time dependent evolution supplemented by in-situ measurements.
With my previous experience in working with several different institutions, I have gained experience in high resolution optical microscopy (Near field optical microscopy, Confocal laser scanning microscope, Phase contrast acoustic microscopy), Advanced signal and data processing, RF signal generation and detection. High speed electronics, Ultrasound tomography, holographic image reconstruction and phase contrast imaging, Structural health assessment (EU FP7, AISHA II), NMR systems and Neurophysical data analysis (4D fMRI data, EEG) and instrument modifications, Plasma physics, Electron microscopy and analysis, Semiconductor thin films, Ultra high vacuum reactors and thin film deposition, FPGA programming and implementation, and Robotic systems.
Peer reviewed journals
Simulating Anomalous Dispersion in Porous Media Using the Unstructured Lattice Boltzmann Method
Marek K. Misztal, Anier Hernandez-Garcia, Rastin Matin, Dirk Müter, Diwaker Jha, Henning O. Sørensen and Joachim Mathiesen
Frontiers in Physics
doi: 10.3389/fphy.2015.00050
Morphology and characterization of Dematiaceous fungi on a cellulose paper substrate using synchrotron X-ray microtomography, scanning electron microscopy and confocal laser scanning microscopy in the context of cultural heritage
H. M. Szczepanowska, D. Jha and Th. G. Mathia
J. Anal. At. Spectrom., 2015, Advance Article
DOI: 10.1039/C4JA00337C
Adaptive center determination for effective suppression of ring artifacts in tomography images.
Jha, Diwaker; Sørensen, Henning Osholm; Dobberschütz, Sören; Feidenhans'l, Robert Krarup; Stipp, Susan Louise Svane.
Applied Physics Letters, Vol. 105, 143107, 2014.
Resolution dependence of petrophysical parameters derived from X-ray tomography of chalk.
Müter, Dirk; Sørensen, Henning Osholm; Jha, Diwaker; Harti, Ralph; Dalby, Kim Nicole; Suhonen, Heikki; Feidenhans'l, Robert Krarup; Engstrøm, F.; Stipp, Susan Louise Svane.
Applied Physics Letters, Vol. 105, Nr. 4, 043108, 2014.
Abstracts
Nanotomography: Resolution, scale, and physical properties
D. JHA, H. O. SØRENSEN, D. MÜTER, S. BRUNS, K. N. DALBY AND S. L. S. STIPP
http://goldschmidt.info/2015/program/programViewAbstractsPDF?period=25h_POSTER
Multiscale Mapping of 3D Tomography data
D. Jha, H. O. Sørensen, D. Müter, S. L. S. Stipp
Microscopy and Microanalysis 20 (3) 2014
This abstract received the presidential scholar award from the Microscopy Society of America.
Posters
Adaptive Ring Artifact Suppression for Tomography Applications
D. Jha, H. O. Sørensen, D. Müter, S. L. S. Stipp
3D Material Science 2014
